We Specialise in High Precision laser etch Solution
Focus for failure analysis and sample preparation
The MELI-2000 enables laser-based sample preparation for a variety of specimen preparation applications. With its integrated ultrashort pulsed laser source, it complements existing approaches to sample preparation such as ion beam processing. MELI-2000 is suited to ablate metals, semiconductors, ceramics, polymers, and compound materials. It creates new vistas for material and process development as well as failure analysis.
• Free-form sample preparation
• Provides samples with micron-level precision
• Sophisticated workflows for automated tasks
• Reduces time-to-sample significantly
• Lower cost per sample
为高通量3D分析和样品制备量身打造,
提升您的聚焦离子束(FIB)样品制备效率
得益于智能激光消除和3D扫描技术,移除材料相比以往实验快40%以上。
特点:
• 较大的面积/纵深
• 快速高精度
• 可重复性
x• 多功能
• 操作简单
• 高自动化
• 进程可视可控化
• 与多种工艺兼容
• 合理的成本消耗
• 友好的样品属性
•SEM分析
•TEM分析
•3D重构分析
•电路连接与芯片级别的结构诊断
•诊断学应用
•加速制样流程
•激光诱导式减薄、箱式减薄、线切割、表面处理等应用。
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